Accelerated Aging Calculator (Arrhenius Model)
Energy required to initiate a degradation process. Typical values for electronic components range from 0.5 eV to 1.5 eV.
The elevated temperature used during the accelerated aging test.
The typical operating temperature of the product or material in its intended environment.
The total time the product or material is subjected to the accelerated test conditions.
Results:
Understanding Accelerated Aging and the Arrhenius Model
Accelerated aging is a critical technique used in engineering, materials science, and product development to predict the long-term reliability and lifespan of products and materials in a significantly shorter timeframe. Instead of waiting years for a product to naturally degrade under normal operating conditions, engineers subject it to elevated stress conditions (like higher temperatures, humidity, or voltage) to speed up the aging process.
Why is Accelerated Aging Important?
- Faster Time-to-Market: Allows manufacturers to quickly assess product durability and make design improvements.
- Cost Reduction: Reduces the need for lengthy and expensive long-term testing.
- Reliability Prediction: Provides data to estimate product lifetime and failure rates under normal use.
- Material Selection: Helps in choosing materials that can withstand environmental stresses over time.
The Arrhenius Model: A Core Principle
One of the most widely used models for accelerated aging, particularly for temperature-dependent degradation mechanisms, is the Arrhenius equation. This model, originally developed to describe the temperature dependence of reaction rates, posits that the rate of many chemical and physical degradation processes increases exponentially with temperature.
The core of the Arrhenius model for accelerated aging is the Acceleration Factor (AF). This factor quantifies how much faster a product ages at an elevated test temperature compared to its normal use temperature. The formula for the Acceleration Factor is:
AF = exp[(Ea / k) * (1/Tuse – 1/Ttest)]
Where:
- AF: Acceleration Factor (dimensionless).
- Ea: Activation Energy (in electron volts, eV). This represents the minimum energy required for a specific degradation mechanism to occur. Different failure mechanisms (e.g., corrosion, diffusion, bond degradation) have different activation energies.
- k: Boltzmann Constant (approximately 8.617 x 10-5 eV/K). This is a fundamental physical constant relating temperature to energy.
- Tuse: Normal Use Temperature (in Kelvin). This is the typical operating temperature of the product in its intended environment.
- Ttest: Accelerated Test Temperature (in Kelvin). This is the elevated temperature at which the accelerated aging test is conducted.
Once the Acceleration Factor (AF) is determined, you can calculate the Equivalent Use Time, which is the duration at normal use conditions that your accelerated test simulates:
Equivalent Use Time = AF * Test Duration
Key Inputs Explained:
- Activation Energy (Ea): This is perhaps the most critical input. It's specific to the failure mechanism being studied. For example, a typical Ea for electronic component degradation might be around 0.7 eV. If you don't know the exact Ea for your specific failure mode, industry standards or literature often provide common values.
- Accelerated Test Temperature: The temperature you choose for your accelerated test. It must be high enough to accelerate aging significantly but not so high that it introduces new failure mechanisms that wouldn't occur under normal use.
- Normal Use Temperature: The average or maximum temperature the product will experience during its normal operational life.
- Accelerated Test Duration: The length of time you run your accelerated test.
Example Scenario:
Imagine you are testing a new electronic component. You want to know how much real-world aging 1000 hours of testing at 85°C simulates, assuming a normal operating temperature of 25°C and an activation energy of 0.7 eV for the dominant failure mechanism.
- Activation Energy (Ea): 0.7 eV
- Accelerated Test Temperature (Ttest): 85°C
- Normal Use Temperature (Tuse): 25°C
- Accelerated Test Duration: 1000 hours
Using the calculator above with these values, you would find an Acceleration Factor of approximately 60.25x. This means that 1000 hours at 85°C is equivalent to roughly 60,250 hours (or about 6.88 years) of aging at 25°C.
Limitations and Considerations:
While powerful, the Arrhenius model has limitations:
- Single Failure Mechanism: It assumes that only one dominant failure mechanism is active and that its activation energy remains constant across the temperature range.
- No New Failure Modes: The accelerated stress conditions should not induce failure modes that would not occur under normal operating conditions.
- Temperature Range: The model is most accurate when the test temperature is not excessively far from the use temperature.
- Other Stresses: Many products degrade due to multiple stresses (humidity, vibration, voltage, UV light). The Arrhenius model primarily addresses temperature. Other models (e.g., Eyring, Peck's Law) are used for other stress factors.
By carefully applying the Arrhenius model and understanding its assumptions, engineers can gain valuable insights into product reliability and make informed decisions during design and manufacturing.